Surface pattern of a Si Mini-Pad sensor for the PHENIX MPC-EX and damage caused by ionizing radiation
Crossref DOI link: https://doi.org/10.3938/jkps.65.25
Published Online: 2014-07-23
Published Print: 2014-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chai, J. -S.
Ghergherehchi, M.
Hahn, K. I.
Han, S. Y.
Jeong, I. W.
Joo, K. S.
Kim, E. J.
Kim, Y. K.
Kistenev, E.
Kwon, Y.
Lajoie, J. G.
Li, Z.
Lee, J. H.
Lim, K. S.
Park, J. M.
Park, K. S.
Song, H. S.
Sue, D. G.
Sukhanov, A.
Text and Data Mining valid from 2014-07-01