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Ellipsometric study of the temperature dependences of the dielectric function and the critical points of AlSb at temperatures from 300 to 803 K

Crossref DOI link: https://doi.org/10.3938/jkps.65.515

Published Online: 2014-09-13

Published Print: 2014-08

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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