A Study on the properties of tellurium-oxide thin films based on the variable sputtering gas ratio
Crossref DOI link: https://doi.org/10.3938/jkps.66.1744
Published Online: 2015-06-19
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kong, Heon
Yeo, Jong-Bin
Lee, Hyun-Yong
Text and Data Mining valid from 2015-06-01