Effect of the Si nanowire’s diameter and doping profile on the electrical characteristics of gate-all-around twin Si-nanowire field-effect transistors
Crossref DOI link: https://doi.org/10.3938/jkps.67.502
Published Online: 2015-08-19
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Dong Hun
Kim, Tae Whan
Text and Data Mining valid from 2015-08-01