Thick AlN epilayer grown by using the HVPE method
Crossref DOI link: https://doi.org/10.3938/jkps.67.643
Published Online: 2015-09-04
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jeon, Hunsoo
Lee, Chanmi
Lee, Chanbin
Yang, Min
Yi, Sam Nyung
Ahn, Hyung Soo
Yu, Young Moon
Lee, Sang Chil
Kim, Suck-Whan
Sawaki, Nobuhiko
Text and Data Mining valid from 2015-08-01