High-resolution X-ray phase-contrast imaging with a grating interferometer
Crossref DOI link: https://doi.org/10.3938/jkps.71.538
Published Online: 2017-10-21
Published Print: 2017-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Seung Wook
Kim, Youngju
Lee, Seho
Oh, Ohsung
Xi, Yan
Yang, Qingsong
Cong, Wenxiang
Wang, Ge
License valid from 2017-10-21