Effects of Electron Beam Irradiation and Thiol Molecule Treatment on the Properties of MoS2 Field Effect Transistors
Crossref DOI link: https://doi.org/10.3938/jkps.72.1203
Published Online: 2018-05-15
Published Print: 2018-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Choi, Barbara Yuri
Cho, Kyungjune
Pak, Jinsu
Kim, Tae-Young
Kim, Jae-Keun
Shin, Jiwon
Seo, Junseok
Chung, Seungjun
Lee, Takhee
Text and Data Mining valid from 2018-05-01
Article History
Received: 7 December 2017
First Online: 15 May 2018