High-temperature ionic and electronic resistivity of MgO- and Ta2O5- doped aluminum nitride
Crossref DOI link: https://doi.org/10.3938/jkps.72.129
Published Online: 2018-01-07
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Dongsu
Lee, Eunsil
Lee, Sung-Min
Kim, Jong-Young
Park, Myung Ha
License valid from 2018-01-01