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Analysis of Deep and Shallow Traps in Semi-Insulating CdZnTe

Crossref DOI link: https://doi.org/10.3938/jkps.72.508

Published Online: 2018-03-13

Published Print: 2018-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Kim, Kihyun

Yoon, Yongsu

James, Ralph B.
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Text and Data Mining valid from 2018-02-01
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Article History

Received: 28 August 2017

Accepted: 2 November 2017

First Online: 13 March 2018