Imaging a Large Sample with Selective Plane Illumination Microscopy Based on Multiple Fluorescent Microsphere Tracking
Crossref DOI link: https://doi.org/10.3938/jkps.72.880
Published Online: 2018-04-18
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ryu, Inkeon
Kim, Daekeun
Text and Data Mining valid from 2018-04-01
Article History
Received: 11 December 2017
Accepted: 12 February 2018
First Online: 18 April 2018