Extreme Metrology for Ultrafast Electron Dynamics at the Atomic Scale
Crossref DOI link: https://doi.org/10.3938/jkps.73.227
Published Online: 2018-07-28
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Dong Eon
Text and Data Mining valid from 2018-07-01
Article History
Received: 23 May 2018
First Online: 28 July 2018