Atomic-level Sharpening of a Carbon Nanotube Tip for High-resolution Scanning Tunneling Microscopy
Crossref DOI link: https://doi.org/10.3938/jkps.73.396
Published Online: 2018-08-23
Published Print: 2018-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Jeehoon
Kim, Suenne
Huang, Junwei
de Lozanne, Alex
Text and Data Mining valid from 2018-08-01
Article History
Received: 16 July 2018
Accepted: 23 July 2018
First Online: 23 August 2018