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Trap Profiling an In-Ga-Zn-O Thin Film Transistor by Using a Transmission Line Model Incorporating the Conductance Method

Crossref DOI link: https://doi.org/10.3938/jkps.73.612

Published Online: 2018-09-06

Published Print: 2018-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nguyen, Manh-Cuong

Nguyen, An Hoang-Thuy

Ji, Hyungmin

Choi, Sujin

Cheon, Jonggyu

Yu, Kyoung-Moon

Cho, Seong-Yong

Kim, Jin-Hyun

Kim, Sang-Woo

Choi, Rino
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Text and Data Mining valid from 2018-09-01
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Article History

Received: 27 February 2018

Accepted: 5 April 2018

First Online: 6 September 2018