Comparative Study of Trans-linear and Trans-impedance Readout Circuits for Optical Beam Deflection Sensors in Atomic Force Microscopy
Crossref DOI link: https://doi.org/10.3938/jkps.74.88
Published Online: 2019-01-26
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Alunda, Bernard Ouma
Otieno, Luke Oduor
Chepkoech, Melody
Byeon, Clare Chisu
Lee, Yong Joong
Text and Data Mining valid from 2019-01-01
Article History
Received: 11 August 2018
Accepted: 18 August 2018
First Online: 26 January 2019