Simulation Study for the Half-Life Measurement of 180mTa Using HPGe Detectors
Crossref DOI link: https://doi.org/10.3938/jkps.75.32
Published Online: 2019-07-08
Published Print: 2019-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, G. W.
Park, S. Y.
Hahn, I. S.
Kim, Y. D.
Lee, M. H.
Leonard, D. S.
Lee, E. K.
Kang, W. G.
Sala, E.
Kazalov, V.
Text and Data Mining valid from 2019-07-01
Version of Record valid from 2019-07-01
Article History
Received: 28 March 2019
Revised: 16 May 2019
Accepted: 23 May 2019
First Online: 8 July 2019