Effect of Contact Resistance on the High-Field Characteristics of MoS2 Transistors
Crossref DOI link: https://doi.org/10.3938/jkps.75.471
Published Online: 2019-09-25
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Seunghyun
Kim, Lok-won
Text and Data Mining valid from 2019-09-01
Version of Record valid from 2019-09-01
Article History
Received: 18 July 2019
Revised: 25 July 2019
Accepted: 25 July 2019
First Online: 25 September 2019