In-Core Power Measurement Using SiC Semiconductor Detector
Crossref DOI link: https://doi.org/10.3938/jkps.76.306
Published Online: 2020-02-22
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Junesic
Son, Jaebum
Kim, Yong Kyun
Park, Se Hwan
Text and Data Mining valid from 2020-02-01
Article History
Received: 20 November 2019
Revised: 27 December 2019
Accepted: 2 January 2020
First Online: 22 February 2020