Structural, Electronic and Optical Characteristics of HgSiX2 (X=P, As) Chalcopyrite Materials: A DFT-Based Computer Simulation
Crossref DOI link: https://doi.org/10.3938/jkps.77.72
Published Online: 2020-07-13
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khalid, Shah
Khenata, Rabah
Ma, Yue
Sun, Xiaoliang
Gao, Meng
Wu, Haicheng
Lu, Guiwu
Yang, Zhenqing
Text and Data Mining valid from 2020-07-01
Version of Record valid from 2020-07-01
Article History
Received: 10 October 2019
Revised: 27 November 2019
Accepted: 9 January 2020
First Online: 13 July 2020