Effects of Oxide-trapped Charges and Interface Traps in Organic Self-assembled Monolayer/Silicon Systems due to Local Current Injection
Crossref DOI link: https://doi.org/10.3938/jkps.77.759
Published Online: 2020-11-15
Published Print: 2020-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Han, Jiwon
Oh, Sangsoo
Kim, Hosup
Kim, Haejong
Choi, Sungwoong
Yang, Jeonghyeon http://orcid.org/0000-0002-6700-6234
Text and Data Mining valid from 2020-11-01
Version of Record valid from 2020-11-01
Article History
Received: 16 July 2020
Revised: 7 August 2020
Accepted: 10 August 2020
First Online: 15 November 2020