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Analysis of Polarization Characteristics Change of the Si-doped HfO2 with Temperature Using Impedance Spectroscopy

Crossref DOI link: https://doi.org/10.3938/jkps.77.784

Published Online: 2020-11-15

Published Print: 2020-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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