Negative charging effect of traps on the gate leakage current of an AlGaN/GaN HEMT
Crossref DOI link: https://doi.org/10.3938/jkps.65.421
Published Online: 2014-08-19
Published Print: 2014-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, J. J.
Lim, J. H.
Yang, J. W.
Stanchina, W.
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