Electrical transport measurements and degradation of graphene/n-Si schottky junction diodes
Crossref DOI link: https://doi.org/10.3938/jkps.66.22
Published Online: 2015-01-20
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, No-Won
Lee, Won-Yong
Lee, Sang-Kwon
Kim, Dong-Joo
Kim, Gil-Sung
Hyung, Jung-Hwan
Hong, Chang-Hee
Koh, Jung-Hyuk
Kim, Keun-Soo
Text and Data Mining valid from 2015-01-01