Temperature-dependent hall measurement of AlGaN/GaN heterostructures on Si substrates
Crossref DOI link: https://doi.org/10.3938/jkps.66.61
Published Online: 2015-01-20
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, In Hak
Kim, Yong Hyun
Chang, Young Jun
Shin, Jong Hoon
Jang, T.
Jang, Seung Yup
Text and Data Mining valid from 2015-01-01