Electrical transport property of ZnO thin films at high H2 pressures up to 20 bar
Crossref DOI link: https://doi.org/10.3938/jkps.69.277
Published Online: 2016-08-18
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chu, Hyunggon
Kim, Byung Hoon
Kang, Joonhee
License valid from 2016-08-01