Investigation of the structural, electrical, and optical properties of MnAl2Se4 layers grown using the hot-wall deposition technique
Crossref DOI link: https://doi.org/10.3938/jkps.69.605
Published Online: 2016-08-27
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
You, S. H.
Hong, K. J.
Jeong, J. W.
Jeong, T. S.
Youn, C. J.
Moon, J. D.
License valid from 2016-08-01