Evaluation of the Built-in Voltage of a Au/n-GaAs Schottky Barrier Diode by Using Electroreflectance Spectroscopy
Crossref DOI link: https://doi.org/10.3938/jkps.72.406
Published Online: 2018-02-09
Published Print: 2018-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Dong-Lyeul
Kim, Geun-Hyoung
Kim, Jong Su
Text and Data Mining valid from 2018-02-01
Article History
Received: 23 August 2017
Accepted: 9 October 2017
First Online: 9 February 2018