Electronic and Thermal Properties of Si-doped InSe Layered Chalcogenides
Crossref DOI link: https://doi.org/10.3938/jkps.72.775
Published Online: 2018-04-04
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yoo, Joonyeon
Kim, Ji-il
Cho, Hyun-jun
Choo, Sung-sil
Kim, Sang-il
Lee, Kimoon
Shin, Weon Ho
Kim, Hyun-Sik
Roh, Jong Wook
Text and Data Mining valid from 2018-04-01
Article History
Received: 16 January 2018
Accepted: 13 February 2018
First Online: 4 April 2018