Characterization of Free-Standing Nano-Membranes by Using Ellipsometry
Crossref DOI link: https://doi.org/10.3938/jkps.72.868
Published Online: 2018-04-18
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, Sungmo
Lee, Changho
An, Ilsin
Kim, Min-Su
Park, Jin-Goo
Ahn, Jin-ho
Text and Data Mining valid from 2018-04-01
Article History
Received: 20 November 2017
Accepted: 12 January 2018
First Online: 18 April 2018