System Design and Evaluation of a Compact and High Energy X-ray Talbot-Lau Grating Interferometer for Industrial Applications
Crossref DOI link: https://doi.org/10.3938/jkps.73.1827
Published Online: 2018-12-29
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Seho
Oh, Ohsung
Kim, Youngju
Lee, Seung Wook
Kim, Insoo
Kim, Jinkyu
Text and Data Mining valid from 2018-12-01
Article History
Received: 8 October 2018
Accepted: 22 November 2018
First Online: 29 December 2018