Investigation of X-ray-induced Defects on Metals and Silicon by Using Coincidence Doppler Broadening Positron Annihilation Spectroscopy
Crossref DOI link: https://doi.org/10.3938/jkps.73.1895
Published Online: 2018-12-29
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, C. Y.
Text and Data Mining valid from 2018-12-01
Article History
Received: 16 October 2018
Accepted: 30 October 2018
First Online: 29 December 2018