Study of Multi-twin Defects Generated in GaAs and InP Films on Nanopatterned Si via Transmission Electron Microscopy
Crossref DOI link: https://doi.org/10.3938/jkps.77.592
Published Online: 2020-10-13
Published Print: 2020-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Juhee
Shin, Hyunsu
Lee, In-Geun
Ko, Dae-Hong
Text and Data Mining valid from 2020-10-01
Version of Record valid from 2020-10-01
Article History
Received: 9 July 2020
Revised: 27 July 2020
Accepted: 27 July 2020
First Online: 13 October 2020