Implementation of a Sinusoidal Raster Scan for High-Speed Atomic Force Microscopy
Crossref DOI link: https://doi.org/10.3938/jkps.77.605
Published Online: 2020-10-13
Published Print: 2020-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Otieno, Luke Oduor
Lee, Yong Joong
Alunda, Bernard Ouma
Text and Data Mining valid from 2020-10-01
Version of Record valid from 2020-10-01
Article History
Received: 13 May 2020
Revised: 18 June 2020
Accepted: 18 June 2020
First Online: 13 October 2020